供应脉冲发生器 DTG5274 泰克-Tektronix

产品名称：脉冲发生器

产品型号：DTG5274/DTG5334

厂商名称：Tektronix(泰克科技)

产品简述：DTG5000 系列数据定时发生器在一个通用的台式设备中，同时提供了数据发生器和脉冲发生器的功能，缩短了复杂测试程序的时间，简化了产生多个通道中低抖动、*时钟信号，并行或串行数据信号的工作。

详细描述：

Features & Benefits
Versatile platform combines features of data generator, pulse generator, and DC source
Up to 3.35 Gb/s data rate
From 1 to 96 Data Channels (Master/Slave)
Cl* Leading Delay Resolution of 0.2 ps (DTG5274/DTG5334), 1 ps (DTG5078), up to 600 ns of Total Delay
Modular architecture helps to protect your investment and allows the instrument to expand with your growing needs
Advanced control over signal parameters to meet most current testing needs, including stressed eye generation
External Jitter Injection (DTGM31, DTGM32 Modules)
Level control with 5 mV resolution
Variable edge slew rates (DTGM10 Modules)
Easy to use and learn shortens time to test
Easily Configure with Plug-in Modules
Intuitive Windows user interface
Bench * form factor
Integrated PC supports network integration and built-in CD-ROM, LAN, floppy drive, U* ports
Up to 64 Mbit pattern depth per channel for complex data patterns

Applications
Semiconductor device functional test and characterization
Support for semiconductor technologies from TTL to LVDS
Initial verification and debugging, comprehensive characterization, manufacturing, and quality control
Compliance and interoperability testing to emerging standards
PCI-Express
Serial ATA/2
InfiniBand
XAUI
HDMI/DVI
Magnetic and optical storage design
Research, development, and test of next-generation devices (HDD, DC/DVD, Blue-ray)
Data conversion device design
Characterization and test of next-generation D/A Convertors
Imaging sensor device design
Characterization and functional testing of next-generation imaging devices (CCD/CMOS)
Jitter transfer and jitter tolerance testing
New serial data standards, expanding networks, and ubiquitous computing continually redefine the cutting-edge of technology. The design engineer is challenged to economize without sacrificing performance.

The DTG5000 Series combines the power of a data generator with the capabilities of a pulse generator in a versatile, bench-* form factor, shortening the duration of complex test procedures and simplifying the generation of low-jitter, high-accuracy clock signals, parallel or serial data across multiple channels. Its modular platform allows you to easily configure the performance of the instrument to your existing and emerging needs to minimize equipment costs. Three mainframes and five plug-in output modules combine to cover a range of applications from legacy devices to the latest technologies. In addition, eight low-current, independently-controlled DC outputs can substitute for external power supplies. Each mainframe incorporates a full compliment of auxiliary input and output channels to easily integrate with other instruments, such as oscilloscopes and logic *yzers, to create a flexible and powerful lab.