ZVR 4G/网络分析仪/R&S/

类型:电子测量 品牌:德国罗德与施瓦茨 型号:ZVR 4G/ 新旧程度:9成新 设备所在地:东莞 设备生产产地:德国 产品数量:10

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Rohde&Schwarz ZVR 4G网络分析仪罗德与施瓦茨10Hz4GHz R&S ZVR 4G矢量网络分析仪|R&S|9KHz至4GHz

厂商名称：德国罗德与施瓦茨Rohde&Schwarz R&S

特点
·9(10)kHz~4GHz频率范围
·高测量速度(<125μs/测量点)
·低固有噪声(-130dB)
·宽动态范围(>130dB)
·高频率分辨率(10μHz)
·校准时间短(<20s)
·有源彩色LCD(26cm)

技术指标
·Data only for 50Ω test sets.For 75Ω test sets and further details please refer to data sheet PD 757.1802.23.Unless otherwise stated,specifications apply to test ports PORT 1 and PORT2,a nominal source power of -10dBm at the test port and an IF bandwidth≤10kHz
·The arrow marks important data.
·Frequency range,measurement speed,dynamicrange
·Frequency range
·Without External Measurements option
·ZVRL,ZVRE,ZVR
·with p*ive test set 50Ω or 75Ω|9kHz to4Ghz
·with active test set 50Ω or 75Ω|300kHz to4GHz
·ZVRL,ZVRE,ZVR|10Hz to 4Ghz
·Relative frequencydeviation|<2*10^-6+1*10^-6/a
·Resolution|10μHz
·Measurement speed(above 2Mhz)
·Number of points|1 to 2001(selectable)
·Measurement time per point|IFbandwidth(IFBW)

	3kHz	10kHz	26kHz
with systemerrorcorrection	<1.50μs	<460μs	<330μs
normalized	<530μs	<230μs	<190μs
FastMode
withsystemerror correction	-	-	<240μs
normalized	-	-	<125μs

·Dynamicrange(without system error correction)
·ZVRL,ZVRE,ZVR
·(models ZVRL and ZVRE:at IF bandwidth 10Hzvalues are reduced by 5dB)

	IFbandwidth
With p*ivetest set50Ω	10Hz	3kHz	10kHz
20kHzto20MHz	>65dB, t*.>110dB	-	-
200kHz to20MHz	>110dB	>90dB	>85dB
20MHz to3Ghz	>120dB	>100dB	>95dB
3Ghz to4Ghz	>110dB	>90dB	>85dB
With activetest set 50Ω
300kHz to1Mhz	>107dB	>87dB	>82dB
1MHz to20MHz	>110dB	>90dB	>85dB
20MHz to3Ghz	>120dB	>100dB	>95dB
3Ghz to4Ghz	>110dB	>90dB	>85dB
With ExternalMeasurements option
50Hz to200kHz	>75dB	-	-
200kHzto20MHz	>110dB	>95dB	>90dB
20MHz to1Ghz	>130dB	>110dB	>105dB
1Ghz to3Ghz	>120dB	>100dB	>95dB
3Ghz to4Ghz	>110dB	>95dB	>90dB

·ZVCE,ZVC
·(mode ZVCE:at IF bandwidth 10Hz values arereduced by 5dB)
·With active test set 50Ω

20kHz to200kHz	>60dB,	-	-
200kHzto20MHz	>100dB	>80dB	>75dB
20Mhz to3Ghz	>120dB	>100dB	>95dB
3Ghz to4Ghz	>110dB	>90dB	>85dB
4Ghz to6Ghz	>105dB	>85dB	>80dB
6Ghz to8Ghz	>100dB	>80dB	>75dB
WithExternal/Measurements option
20kHz to200kHz	>75dB	-	-
200kHz to20Mhz	>110dB	>95dB	>90dB
20MHz to1GHz	>130dB	>110dB	>105dB
1Ghz to3Ghz	>120dB	>100dB	>95dB
3Ghz to4Ghz	>110dB	>95dB	>90dB
4GHz to6GHz	>105dB	>90dB	>85dB
6Ghz to8GHz	>100dB	>85dB	>80dB
Stability ofmeasurement trace per degree temperaturevariation ZVRL,ZVRE,ZVR	<0.05dBor 0.4°
Measurementbandwidth
(IFbandwidthIFBW)	1Hz to 10kHz(half-decadesteps ) and 26kHz(full)

·Measurementaccuracy
·The following data are validbetween20℃ and30℃ provided the instrument has reached thermal equilibrium (about 1 h after switch-on)and the tempera-ture has not varied by more than 1 degree after calibration.
·ZVRE and ZVR(bidirectional network*yzers)
·Accuracy of tran*ission measurementsafter full two-part system error cor-rection(TOSM)
·Specificaitons are based on a matched DUTand refer to a nominal source power of -10dBm at the test port.
·With test set 50Ω
·300kHz to 4Ghz
·at IF bandwidth 10Hz
·for+10dB to +3dB|<1dB or 6°
·for+3dB to -5dB|<0.2dB or 1°
·for -5dB to -60dB(p*ive)|<0.05dB or0.4°
·for-5dB to -60dB(active)|0.2dB or 1°
·for+3dB to -40dB|t*.<0.025dB
·for-60dB to -70dB|<0.2dB or 1°
·for-70dB to -80dB(ZVRE)|<1dB or 6°
·for-70dB to -85dB(ZVR)|<1dB or 6°
·Accuracy of reflection measurements
·after system error correction (TOSM orfull one-port)
·Specificaitons are based on an isolationgDUT and refer to a nominal source power of -10dBm at the testport.
·With test set 50Ω
·It is *umed that the return loss of thematch used for calibration is >46dB(effective systemdata:directivity Deff>46dB,test port match Seff>30dB).
·20kHz to 4Ghz(p*ive test set),
·300kHz to 4GHz(active test set)
·for+10dB to +3dB|<1dB or 6°
·for+3dB to -15dB|<0.4dB+0.04dB/Ghz,<3°+0.4°/Ghz
·for-15dB to -25dB|<1dB or 6°
·for-25dB to -35dB|<3dB or 20°
·ZVCE and ZVC
·Accuracy of tran*ission measurements
·after full two-part system errorcorrection(TOSM)
·Specifications are based on a matched DUTand refer to a nominal source power of -20dBm at the test port.
·10MHz to 4Ghz
·at IF bandwidth 10Hz
·for +10dB to +3dB|<1dB or 6°
·for+3dB to -50dB|<0.2dB or 1°
·for+3dB to -40dB|t*.<0.025dB
·for-50dB to -60dB|<0.5dB or 4°
·for-60dB to -70dB(ZVCE)|<1dB or 6°
·for-60dB to -75dB(ZVC)|<1dB or 6°
·4Ghz to 8Ghz
·at IF bandwidth 10Hz
·for+10dB to +3dB|<1dB or 6°
·for+3dB to -45dB|<0.2dB or 2°
·for+3dB to -40dB |t*.<0.025dB
·for-45dB to -55dB(ZVCE)|<1dB or 6°
·for-45dB to -60dB(ZVC)|<1dB or 6°
·Accuracy of reflection measurements
·after system error correction (TOSM orfull one-port)
·Specifications are based on an isolaitngDUT and refer to a nominal source power of -20dBm at the testport.
·It is *umed that the return loss of thematch used for calibration is >40dB(effective systemdata:directivity Deff>40dB,test port match Seff>30dB).
·20kHz to 8Ghz
·for+10dB to +3dB|<1dB or 6°
·for+3dB to- ·10dB|<0.4dB+0.04dB/GHz,<3°_0.4°/Ghz
·for=\-10dB to -20dB|<1dB or 6°
·for-20dB to -30dB|<3dB or 20°
·ZVRL(unidirectional network *yzer)
·Accuracy of tran*ission measurements
·after system error correction (one-pathtwo-port)
·Specifications are based on a matched DUTand refer to a nominal source power of -10dBm at the test port.
·With test set 50Ω
·It is *umed that the return loss of thematch used for calibration is >46dB(effective systemdata:directivity Deff>46dB,test port match Seff>30dB).
·20khz to 4Ghz
·for+10dB to +3dB|<1dB or 6°
·for+3dB to -15dB?|<0.4dB+0.04dB/Ghz,<3° +0.4°/Ghz
·for-15dB to -25dB|<2dB or 6°
·for-25dB to -35dB|<3dB or 20°
·Effective system characteristics(above200kHz)
·These data are valid between20℃ and30℃ provided the instrument has reached thermal equilibrium(about 1h after swithc-on)and the temperature variations is not more than 1 degree after calibration.
ZVRE,ZVR,ZVCE,ZVC(bidirectional network *yzers)
·After full two-port system errorcorrection(TOSM)
·ZVRL
·After system error corrction(one-pathtwo-port)
·Directivity|>46dB^1)
·Source mathch(PORT 1)|>30dB
·Load match(PORT 2)|>18dB
·Tran*ission tracking|<0.2dB
·Reflection tracking|<0.06dB
·Output power
·Power range(without options)
·ZVRL,ZVRE,ZVR with test set 50Ω|-25dBm to0dBm
·ZVRL,ZVRE,ZVR with test set 75Ω|-27dBm to-6dBm
·ZVCE,ZVC
·20kHz to 6GHz|-25dBm to 0dBm
·6GHz to 8GHz|-25dBm to -3dBm
·Deviation(at -10dBm)
·These data are valid between20℃ and30℃
·up to2Mhz|<1dB
·above 2Mhz|<0.5dB
·Linearity(referred to -10dBm)
·0dBm to -25dBm(up to 20kHz)|<0.8dB
·0dBm to -15dBm(above 20kHz)|<0.4dB
15dBm to -25dBm|<0.6dB
·Resolution|0.1dB
·Spectral purity
·Harmonics|ZVRL,ZVRE,ZVR|ZVCE,ZVC

40kHz to400MHz	<-25dBc	<-25dBc
above400MHz	<-30dBc	<-25dBc
At-10dBm sourcepower
up to600MHz	<-35dBc	<-35dBc
above600MHz	<-40dBc	<-35dBc
Spurious	<-40dBc
S*phasenoise
1Hzbandwidth,10kHz from carrier
up to10MHz	<-110dBc
10MHz to150MHz	<-100dBc
150MHz to1Ghz	<-90dBc
above 1Ghz	<-90dBc+20.log(f/GHz) (<-78dBc at4Ghz),<-72dBc at 8Ghz)
ResidualFM
RMS weighfingfrom 10Hz to 3kHz
up to10MHz	<1Hz
150MHz to1Ghz	<5Hz
1Ghzto2Ghz	<10Hz
2Ghzto4Ghz	<20Hz
above4Ghz	<40Hz
Inputlevel
Maximum nominalinput level	Receiverstepattenuator
	0dB	≥30dB
Withou*tions	0dBm	-
With receiverStepAttenuator option	0dBm	+27dBm
Damagelevel
Withou*tions	+27dBm	-
With ReceiverStep Attenuator option	+27dBm	+30dBm
DamageDCcurrent/voltage
With p*ivetest set(internal DC short Rin<0.1Ω)	0.5A
With activetest set	0.5Aor 30V
RMSnoiselevel(50Ω,without options)
With 75Ωmodelsthe noise level is higher by 6dB
Frequencyrange	IFbandwidth	Noiselevel
9khz to50khz	1kHz	<-75dBm
50kHz to200khz	3kHz	<-70dBm
200khz to20Mhz	3khz	<-90dBm
20MHz to3Ghz	3Ghz	<-100dBm
3Ghzto4Ghz	3Ghz	<-90dBm
4Ghzto8Ghz	3kHz	<-80dBm