TC58BVG1S3HTA00 《3.3V, 2 Gbit CMOS NAND》

2 GBIT (256M × 8 BIT) CMOS NAND E 2 PROM

DESCRIPTION

The TC58BVG1S3HTAI0 is a single 3.3V 2 Gbit (2,214,592,512 bits) NAND Electrically Erasable and

Programmable Read-Only Memory (NAND E 2 PROM) organized as (2048 + 64) bytes × 64 pages × 2048blocks.

The device has a 2112-byte static register which allows program and read data to be transferred between the

register and the memory cell array in 2112-bytes increments. The Erase operation is implemented in a single block

unit (128 Kbytes + 4 Kbytes: 2112 bytes × 64 pages).

The TC58BVG1S3HTAI0 is a serial-type memory device which utilizes the I/O pins for both address and data

input/output as well as for command inputs. The Erase and Program operations are automatically executed making

the device most suitable for applications such as solid-state file storage, voice recording, image file memory for still

cameras and other systems which require high-density non-volatile memory data storage.

The TC58BVG1S3HTAI0 has ECC logic on the chip and 8bit read errors for each 528Bytes can be corrected

internally.

FEATURES

•  Organization

x8

Memory cell array  2112 × 128K × 8

Register  2112 × 8

Page size  2112 bytes

Block size  (128K + 4K) bytes

•  Modes

Read, Reset, Auto Page Program, Auto Block Erase, Status Read, Page Copy,

Multi Page Read, Multi Page Program, Multi Block Erase, ECC Status Read

•  Mode control

Serial input/output

Command control

•  Number of valid blocks

Min 2008 blocks

Max 2048 blocks

•  Power supply

V CC = 2.7V to 3.6V

•  Access time

Cell array to register 40 μs typ. (Single Page Read) / 55us typ. (Multi Page Read)

Serial Read Cycle  25 ns min (CL=50pF)

•  Program/Erase time

Auto Page Program  330 μs/page typ.

Auto Block Erase  3.5 ms/block typ.

•  Operating current

Read (25 ns cycle)  30 mA max.

Program (avg.)  30 mA max

Erase (avg.)  30 mA max

Standby  50 μA max

•  Package

TSOP I 48-P-1220-0.50 (Weight: TBD g typ.)

•  8bit ECC for each 528Byte is implemented on a chip.